Test data compression and decompression based on internal scan chains and golomb coding - Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

We present a data compression method and decompression architecture for testing embedded cores in a system-on-a-chip (SOC). The proposed approach makes effective use of Golomb coding and the internal scan chain(s) of the core under test and provides significantly better results than a recent compression method that uses Golomb coding and a separate cyclical scan register (CSR). The major advantages of Golomb coding of test data include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. The use of the internal scan chain for decompression obviates the need for a CSR, thereby reducing hardware overhead considerably. In addition, the novel interleaving decompression architecture allows multiple cores in an SOC to be tested concurrently using a single ATE I/O channel. We demonstrate the effectiveness of the proposed approach by applying it to the ISCAS 89 benchmark circuits.